Last month, we have shared our plans for implementing per-program Z-height mapping in this blog post as well as in this beta-tester manual on our documentation website. Since first sharing the news about this height mapping feature we have added a number of options to configure the mapping process, including variable probe speeds, settings for variable probe lift and an option to manually take a number of measurements at necessary points to create a custom point array. At this point, the height mapping feature has been realized on the X1366M, X1366M4 and X1366M6 mill profiles. Additionally, testing and further development is planned for the X1366V profile. 

Height mapping is currently being tested by a number of our customers. One of them has shared a video of a successful mapping test:

This feature will continue to be tweaked and updated in the upcoming days and weeks. Stay tuned for a full release!